Electronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction band

dc.contributor.authorAuret, Francois Danie
dc.contributor.authorMeyer, Walter Ernst
dc.contributor.authorJanse van Rensburg, Pieter Johan
dc.contributor.authorHayes, M.
dc.contributor.authorNel, Jacqueline Margot
dc.contributor.authorVon Wenckstern, Holger
dc.contributor.authorSchmidt, H.
dc.contributor.authorBiehne, G.
dc.contributor.authorHochmuth, H.
dc.contributor.authorLorenz, M.
dc.contributor.authorGrundmann, Marius
dc.date.accessioned2008-06-05T11:27:34Z
dc.date.available2008-06-05T11:27:34Z
dc.date.issued2007-12
dc.description.abstractPlease refer to abstract in articleen
dc.format.extent265167 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationAuret, FD, Meyer, WE, Janse van Rensburg, PJ, Hayes, M, Nel, JM, Von Wenckstern, H, Schmidt, H, Biehne, G, Hochmuth, H, Lorenz, M & Grundmann, M 2007, 'Electronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction band', Physica B : Condensed Matter, vol. 401-402, pp. 378-381.en
dc.identifier.isbn10.1016/j.physb.2007.08.192
dc.identifier.issn0921-4526
dc.identifier.urihttp://hdl.handle.net/2263/5815
dc.language.isoenen
dc.publisherElsevieren
dc.rightsElsevieren
dc.subjectZnOen
dc.subjectHigh resolution Laplace DLTSen
dc.subjectDefectsen
dc.subject.lcshSemiconductorsen
dc.subject.lcshDeep level transient spectroscopyen
dc.subject.lcshZinc oxideen
dc.subject.lcshPulsed laser depositionen
dc.titleElectronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction banden
dc.typeArticleen

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