Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
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Date
Authors
Nyamhere, Cloud
Das, A.G.M.
Auret, Francois Danie
Chawanda, Albert
Mtangi, Wilbert
Odendaal, R.Q. (Quintin)
Carr, Alan
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
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Description
Keywords
Laplace DLTS, DLTS, Defects
Sustainable Development Goals
Citation
C.Nyamhere, et al., Physica B (2009), doi:10.1016/j.physb.2009.09.037