Oscillation-based test in a CCII-based bandpass filter
dc.contributor | tinus.stander@up.ac.za | en_ZA |
dc.contributor.author | Petrashin Pablo | |
dc.contributor.author | Toledo, Luis | |
dc.contributor.author | Lancioni, Walter | |
dc.contributor.upauthor | Osuch, Piotr Jan | |
dc.contributor.upauthor | Stander, Tinus | |
dc.date.accessioned | 2017-03-06T08:22:08Z | |
dc.date.available | 2017-03-06T08:22:08Z | |
dc.date.issued | 2017-02 | |
dc.description | Paper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017. | en_ZA |
dc.description.abstract | Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first time. Adopting a CCII-based band pass filter as a case study, it is shown that OBT can be implemented with a minimally intrusive switched feedback loop to establish the oscillator. Exhaustive fault simulation indicates 98.11% detection of possible short circuit and 100% detection of possible open circuit faults in the circuit under test, in both 0.35μm and 1.2μm CMOS technology nodes. | en_ZA |
dc.description.librarian | hb2017 | en_ZA |
dc.description.sponsorship | The Argentina – South Africa Research Cooperation Programme, as administered by the Ministry of Science, Technology and Productive Innovation in Argentina and the National Research Foundation in South Africa. | en_ZA |
dc.identifier.citation | Petrashin, PA, Toledo, LE, Lancioni, W , Stander, T & Osuch, PJ 2017, 'Oscillation-based test in a CCII-based bandpass filter', 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017, pp. 17-20. | en_ZA |
dc.identifier.uri | http://hdl.handle.net/2263/59274 | |
dc.language.iso | en | en_ZA |
dc.publisher | Institute of Electrical and Electronics Engineers | en_ZA |
dc.rights | © 2017 Institute of Electrical and Electronics Engineers | en_ZA |
dc.subject | Continuous time filters | en_ZA |
dc.subject | Analog testing | en_ZA |
dc.subject | Fault simulation | en_ZA |
dc.subject | Testing | en_ZA |
dc.subject | Oscillation based testing (OBT) | en_ZA |
dc.subject | Second-generation current conveyor (CCII) | en_ZA |
dc.title | Oscillation-based test in a CCII-based bandpass filter | en_ZA |
dc.type | Text | en_ZA |