Oscillation-based test in a CCII-based bandpass filter

dc.contributortinus.stander@up.ac.zaen_ZA
dc.contributor.authorPetrashin Pablo
dc.contributor.authorToledo, Luis
dc.contributor.authorLancioni, Walter
dc.contributor.upauthorOsuch, Piotr Jan
dc.contributor.upauthorStander, Tinus
dc.date.accessioned2017-03-06T08:22:08Z
dc.date.available2017-03-06T08:22:08Z
dc.date.issued2017-02
dc.descriptionPaper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017.en_ZA
dc.description.abstractOscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first time. Adopting a CCII-based band pass filter as a case study, it is shown that OBT can be implemented with a minimally intrusive switched feedback loop to establish the oscillator. Exhaustive fault simulation indicates 98.11% detection of possible short circuit and 100% detection of possible open circuit faults in the circuit under test, in both 0.35μm and 1.2μm CMOS technology nodes.en_ZA
dc.description.librarianhb2017en_ZA
dc.description.sponsorshipThe Argentina – South Africa Research Cooperation Programme, as administered by the Ministry of Science, Technology and Productive Innovation in Argentina and the National Research Foundation in South Africa.en_ZA
dc.identifier.citationPetrashin, PA, Toledo, LE, Lancioni, W , Stander, T & Osuch, PJ 2017, 'Oscillation-based test in a CCII-based bandpass filter', 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017, pp. 17-20.en_ZA
dc.identifier.urihttp://hdl.handle.net/2263/59274
dc.language.isoenen_ZA
dc.publisherInstitute of Electrical and Electronics Engineersen_ZA
dc.rights© 2017 Institute of Electrical and Electronics Engineersen_ZA
dc.subjectContinuous time filtersen_ZA
dc.subjectAnalog testingen_ZA
dc.subjectFault simulationen_ZA
dc.subjectTestingen_ZA
dc.subjectOscillation based testing (OBT)en_ZA
dc.subjectSecond-generation current conveyor (CCII)en_ZA
dc.titleOscillation-based test in a CCII-based bandpass filteren_ZA
dc.typeTexten_ZA

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