Oscillation-based test in a CCII-based bandpass filter
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Date
Authors
Petrashin Pablo
Toledo, Luis
Lancioni, Walter
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers
Abstract
Oscillation based testing (OBT) has proven to be a
simple yet effective VLSI test for numerous circuit types. In this work,
OBT is applied to test Second-generation Current Conveyor (CCII)
based filters for the first time. Adopting a CCII-based band pass filter
as a case study, it is shown that OBT can be implemented with a
minimally intrusive switched feedback loop to establish the oscillator.
Exhaustive fault simulation indicates 98.11% detection of possible
short circuit and 100% detection of possible open circuit faults in the
circuit under test, in both 0.35μm and 1.2μm CMOS technology
nodes.
Description
Paper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017.
Keywords
Continuous time filters, Analog testing, Fault simulation, Testing, Oscillation based testing (OBT), Second-generation current conveyor (CCII)
Sustainable Development Goals
Citation
Petrashin, PA, Toledo, LE, Lancioni, W , Stander, T & Osuch, PJ 2017, 'Oscillation-based test in a CCII-based bandpass filter', 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017, pp. 17-20.