Analysis of current voltage measurements on Au/Ni/n-GaN Schottky contacts in a wide temperature range
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Date
Authors
Mtangi, Wilbert
Janse van Rensburg, Pieter Johan
Diale, M. (Mmantsae Moche)
Auret, Francois Danie
Nyamhere, Cloud
Nel, Jacqueline Margot
Chawanda, Albert
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
Current-voltage characteristics of Au/Ni/n-GaN Schottky contacts have been measured in the
60-320 K temperature range. The zero bias barrier height, bo and ideality factor, n have been
studied as a function of temperature. The sharp increase in ideality factor at low temperatures
has been explained as an effect of thermionic field emission. The deviation of the
characteristics from the ideal thermionic behaviour are more pronounced with a decrease in
temperature, in which the results obtained indicate the presence of other current transport
mechanisms in the 60-280 K temperature range and the dominance of pure thermionic
emission current at 300 K. The increase in barrier height with increasing temperature has
been explained as an effect of barrier inhomogeneities.
Description
Keywords
Schottky contacts, Barrier height, Temperature dependence, Schottky-barrier diodes
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Citation
Mtangi, W, Janse van Rensburg, PJ, Dale, M, Auret, FD, Nyamhere, C, Nel, JM & Chawanda, A 2010, 'Analysis of current voltage measurements on Au/Ni/n-GaN Schottky contacts in a wide temperature range', Materials Science and Engineering: B, vol. 171, no. 1-3, pp. 1-4. [www.elsevier.com/locate/mseb]